On October 16, a delegation of 4 members led by Tang Zhiming, Deputy Director of the Photoelectric Technology Invention Review Board of CNIPA, visited Shanghai Intellectual Property Court for investigation and exchange. Ms. Li Shulan, Vice President of Shanghai Intellectual Property Court, Ms. Chen Huizhen, full-time member of the trial committee, head of Intellectual Property No. 1 Tribunal and Technical Investigation Office, some judges and technical investigators attended the forum. Vice President Li Shulan welcomed Deputy Head Tang Zhiming and his delegation and expressed gratitude to the Patent Office for its support to the work of our court. She introduced the basic situation of Shanghai Intellectual Property Court, the trial of patent cases and the performance of technical investigators working at our court, and expressed the hope to strengthen cooperation and exchange with the Patent Office in future work. The two sides also exchanged on the trial of patent infringement disputes, the legal issues relating to patent authorization encountered during trials, the development of the technical investigator system, the enhanced connection of intellectual property administration and justice, and personnel exchanges, etc. Deputy Head Tang Zhiming thanked Shanghai Intellectual Property Court for its warm reception and thoughtful arrangements, and invited judges to the patent office for exchange with examiners. They also visited the court, the filing hall, the litigation service center, the mediation room, etc., and audited a public trial of patent infringement dispute.