On the morning of April 12, Guan Xiaoli, full-time Deputy Secretary of the Party Committee, Yi Jun, Head of Technical Investigation Division and other staff of Beijing Intellectual Property Court totaling 6 people visited Shanghai Intellectual Property Court to inspect the work of technical investigators. Wu Denglou, Deputy Director of the Technical Investigation Division, and Shou Zhongliang were assigned to greet the guests. Deputy Director Wu Denglou introduced the staffing, systems and centralized management and coordinated development of the “four-in-one” system (technical investigation, technical consultation, expert jury and technical appraisal) of our Technical Investigation Division since its establishment and answered the questions raised by the attendees, while Director Yi Jun introduced the performance and relevant practices of the technical investigator system of Beijing Intellectual Property Court. The two sides discussed the appointment of technical investigators and other issues of common concern, and said that in the future, they will strengthen the exchange of information and jointly study and solve new situations and problems encountered in the operation of the technical investigator system.